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The FEI Nova 600i (also called Nova NanoLab 600i) is a DualBeam system combining a field emission scanning electron microscope (FESEM) with a gallium focused ion beam (Ga FIB) for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.
The Nova 10-160 is an equipment model manufactured by Nova, with no further technical details provided in available sources.
Nova NOVASCAN 3090 is a CMP metrology platform for semiconductor process control. Nova NOVASCAN 3090 supports measurement of solid areas, 2D structures, and 3D shape characterization with a single polarized channel from Deep-UV to Near-IR.
The Nova NanoSEM 230 is a field emission scanning electron microscope (FE-SEM).
The Nova V 2600 is a CMP (Chemical Mechanical Polisher) for 12-inch wafers.