Applied Materials SEMVision

Models in this family

1. 

   SEMVision G 2 CD-SEM

   Applied Materials SEMVision G 2 is a CD-SEM (Critical Dimension Scanning Electron Microscope) with EDX, HDD, and software included.

2. 

   SEMVision G 3

   Applied Materials SEMVision G 3 is an inspection system described with 8-inch and 12-inch wafer handling capability.

3. 

   SEMVision G 3 Lite DR-SEM

   Applied Materials SEMVision G 3 Lite DR-SEM is a defect review scanning electron microscope with optional EDX, tilt, and wafer rotation options.

4. 

   SEMVision G 4

   The Applied Materials SEMVision G4 is a defect analysis system used for mask inspection.