Waferpedia

Zeiss

Merlin

Metrology & Inspection4"Zeiss Merlin family
Research Quality: 50% complete

Zeiss MERLIN is a scanning electron microscope at CMi. Zeiss MERLIN has a GEMINI II column and a 5-axis motorized stage. Zeiss MERLIN supports a full 4 inch wafer holder.[1]

Merlin — epfl.ch
Fig. 01Merlinepfl.ch[1]
  • Plate 01VOLK MERLIN on Zeiss microscope

    Facundo BWatch on YouTube
  • Plate 02ZEISS MERLIN 3View and SIGMA VP 3View - SBF-SEM/SBEM Workflow Animation

    ZEISS MicroscopyWatch on YouTube
  • Plate 03SEM EDX analysis using Zeiss Merlin equipment | Full version

    Ahror IsmoiliWatch on YouTube

Wafer size

4"

Optics

GEMINI II[1]

How it works

The Zeiss Merlin uses a GEMINI II column with a Schottky field emitter as the electron source. The emitted electrons are accelerated by an acceleration voltage, and a beam booster maintains high electron energy throughout the column to reduce sensitivity to magnetic stray fields and minimize beam broadening.[1]

The column can be operated in different modes, including high-resolution, analyzer, and depth-of-field modes, which adjust condenser excitations and aperture settings to optimize imaging for different applications. The microscope is controlled via the ZeissSmartSEM software through a graphical user interface, with a dual joystick for stage control and a keyboard control panel for direct access to frequently used functions.[1]

The system is fitted with three detectors: an In-Lens detector for high-resolution secondary electron imaging, a HE-SE2 Everhart-Thornley detector for topography, and an EsB in-column detector with filtering grid for pure material contrast. The specimen stage is eucentric with five axes (X, Y, Z, tilt, rotation), ensuring focus is maintained during tilting.[1]

Applications

The detectors enable imaging of secondary and backscattered electrons, and the instrument can perform energy-dispersive X-ray analysis with additional training. The system is suitable for examining various materials, including non-conductive samples and polymers, using appropriate detector settings.[1]

  • Imaging for process control
  • Offline analysis and metrology
  • Elemental compositional analysis by EDX

What do the numbers mean?

Wafer handling5

Loadlock
Semi-automatic airlock[1]
Accurate?
Available holders
mono samples, cleaved samples, and full 4 inch wafer[1]
Accurate?
Loadlock
Semi-automatic airlock/loadlock[1]
Accurate?
Holders
Mono samples, cleaved samples, and full 4 inch wafer[1]
Accurate?
Sample holders
mono samples, cleaved samples, full 4 inch wafer[1]
Accurate?

Optics & imaging9

Column
GEMINI II[1]
Accurate?
Detectors
In-Lens, HE-SE2, EsB, and EDX detector[1]
Accurate?
Column
GEMINI II electron optical column[1]
Accurate?
Detector
In-Lens detector[1]
Accurate?
Detector
HE-SE2 detector[1]
Accurate?
Detector
EsB detector with filtering grid[1]
Accurate?
Detector
EDX detector[1]
Accurate?
Electron optical column
GEMINI II[1]
Accurate?
Detector types
In-Lens, HE-SE2, EsB, EDX[1]
Accurate?

Control & software3

Control software
ZeissSmartSEM[1]
Accurate?
Control software
ZeissSmartSEM software[1]
Accurate?
Software for offline analysis and metrology
ProSEM software[1]
Accurate?

Configuration & options5

Instrument type
Scanning electron microscope (SEM)[1]
Accurate?
Stage
5-axis motorized stage (X, Y, Z, Tilt and Rotation)[1]
Accurate?
Stage
5-axis motorized stage (X, Y, Z, Tilt, Rotation)[1]
Accurate?
Instrument type
SEM (scanning electron microscope)[1]
Accurate?
Stage
5-axes motorized stage (X, Y, Z, Tilt and Rotation)[1]
Accurate?
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What replaced it?

  • siblingZeiss Leo 1550— Listed in the same equipment section as Zeiss MERLIN.source[1]
  • siblingZeiss CrossBeam 550— The basic training notes differences between the SEM Crossbeam and SEM MERLIN, and state that being fully trained on SEM MERLIN is a prerequisite.source[2]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What column does the Zeiss Merlin use?

The Zeiss Merlin uses a GEMINI II column with a Schottky field emitter and a combined electrostatic/electromagnetic lens doublet.[1]

What stage does the Zeiss Merlin have?

The stage is motorized with five axes (X, Y, Z, tilt, rotation) and is eucentric, meaning all rotation axes intersect at a single point.[1]

What detectors are available on the Zeiss Merlin?

Three detectors are fitted: an In-Lens detector for high-resolution SE imaging, a HE-SE2 Everhart-Thornley detector for topography, and an EsB with filtering grid for pure material contrast.[1]

Can the Zeiss Merlin perform EDX analysis?

EDX analysis is possible after additional training, and it requires full confirmation of SEM imaging first.[1]

What software controls the Zeiss Merlin?

The microscope is controlled by the ZeissSmartSEM software via a graphical user interface.[1]

Not publicly documented

The following facts about the Merlin are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Merlin are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Merlin are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Merlin are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Merlin are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Merlin is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]epfl.ch — epfl.chepfl.ch
  2. [2]epfl.chepfl.ch
  3. [3]Capabilities | UD Nanofabrication Facility — udnf.udel.eduudnf.udel.edu
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Last updated Oct 8, 2026.

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