Teradyne
ETS 200 T
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Teradyne / Eagle ETS 200 T is a tester. The Teradyne / Eagle ETS 200 T is used with an Electroglas EG 4090 prober for 8-inch wafers.[1]
What it is
The Teradyne ETS 200 T is a test system manufactured by Teradyne and Eagle.[1]
How it works
General reference — not yet source-verifiedMixed-signal testers like the ETS series provide stimulus and measurement for both analog and digital signals. The system uses a modular architecture with plug-in instrument cards that generate waveforms, apply voltages or currents, and capture responses. The test head interfaces directly with the prober or handler, routing signals to the device under test through a probe card or contactor.
Where it fits in the process flow
General reference — not yet source-verifiedIn semiconductor manufacturing, mixed-signal testers are used for wafer sort (also called probe test) and final package test. Wafer sort occurs after all fabrication steps are complete, before dicing and packaging. The probed wafer is then singulated, and good die are assembled into packages. Final test on packaged devices may use a separate handler-based test system.
Applications
General reference — not yet source-verifiedMixed-signal testers are applied to devices that combine analog and digital circuitry, such as power management ICs, audio amplifiers, data converters, sensor interfaces, and RF transceivers. The ETS platform is suited for production testing of medium- to high-volume mixed-signal devices requiring parametric accuracy and repeatability.
What do the numbers mean?
Configuration & options2
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- LTX-Credence ASL 3000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Advantest V 93000 PS 1600— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence Fusion HFT— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Accretech UF 3000 Automatic Wafer— Same function class: Test & Probe, UnknownCompare in depthsource[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the ETS 200 T are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
Fewer than 3 independently cited specifications for the ETS 200 T are on record; the remainder await public documentation.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the ETS 200 T are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the ETS 200 T are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the ETS 200 T are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the ETS 200 T are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (1)Every fact above is drawn from these public sources
- [1]Inventory photo
Last updated Sep 24, 2026.
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The LTX / Credence ASL 3000 is a semiconductor tester with a computer configuration including a Pentium 4 processor, 1GB RAM, 80GB HDD, and Windows NT 4.0 operating system.
The LTX-Credence Fusion HFT is a configurable semiconductor tester used for device testing in production and NPI development.
The Accretech / TSK UF 3000 is an automatic wafer prober.
