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MetaPulse 200 Film Thickness Measurement
The MetaPulse 200 Film Thickness Measurement is a film thickness measurement system. The MetaPulse 200 Film Thickness Measurement is a tool for 8-inch wafers. The MetaPulse 200 Film Thickness Measurement is an opaque film metrology tool for multilayer metal film stacks.[1][2][3]
What it is
How it works
The MetaPulse 200 employs picosecond ultrasonic laser sonar (PULSE Technology), a non-contact, non-destructive measurement technique based on laser-induced ultrasound. An ultrafast 800 nm laser generates acoustic pulses that propagate through the film stack; reflected echoes are detected to determine layer thicknesses and material properties.[4][3]
What do the numbers mean?
Power & electrical7
Wafer handling3
Optics & imaging2
Control & software2
Configuration & options9
Vintage & configurations
- 1998Production start[4]
Year of manufacture stated as 1998.
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the MetaPulse 200 Film Thickness Measurement are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented variants, configuration options, or revision breakpoints of the MetaPulse 200 Film Thickness Measurement are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the MetaPulse 200 Film Thickness Measurement are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MetaPulse 200 Film Thickness Measurement are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the MetaPulse 200 Film Thickness Measurement is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the MetaPulse 200 Film Thickness Measurement are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]MetaPULSE 200 — semiconductoronline.comsemiconductoronline.com
- [4]rawbw.com — rawbw.comrawbw.com
- [5]Inventory photo
- [6]Inventory photo
Last updated Oct 4, 2026.
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