Nikon
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The Nikon MM 400 is a measuring microscope.[1]

Nikon MM 400 is a measuring microscope.[1]
Measuring microscopes utilize a compound optical system with an objective lens and eyepiece to produce a magnified image of the workpiece. A precision stage moves the sample in two axes, and an integrated measurement scale or digital encoder records position coordinates for distance, angle, or radius measurements.
Primary applications include measurement of line widths, overlay registration, feature placements, and defect review on semiconductor wafers and photomasks. The instrument is also used in metrology of MEMS devices, micro-optics, precision mechanical parts, and other microfabricated structures.
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The following facts about the MM 400 Measuring are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the MM 400 Measuring are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the MM 400 Measuring are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the MM 400 Measuring are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the MM 400 Measuring are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the MM 400 Measuring are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Sep 26, 2026.
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