KLA
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The KLA HRP 350 is a profilometer. KLA manufactures the HRP 350. The HRP 350 is a metrology and inspection instrument.[1][2]
Stylus-based profilometers carry a diamond-tipped stylus in light contact with the sample surface. The sample moves beneath the stylus while the vertical motion of the stylus is converted into an electrical signal by a displacement transducer. The recorded signal yields a height-versus-lateral-position trace of the scanned line.
Scanning in such instruments is performed by a precision translation stage that moves the sample under the stylus at a controlled rate. The stylus force is regulated to follow the surface without damaging it. The resulting profile is displayed and analyzed for parameters such as step height, roughness, and waviness.
Profilometers are used as metrology tools in semiconductor fabrication, where they measure patterned features created by deposition, etching, and planarization processes. Such measurements are used to control film thickness through step-height monitoring and to evaluate the quality of polished or etched surfaces.
A profilometer typically measures dedicated monitor wafers or selected device structures after key process steps. The results support process qualification, equipment matching, and routine statistical process control.
Profilometry is also applied outside semiconductor devices, for example on magnetic storage media, microelectromechanical systems, optical elements, and flat-panel substrates.
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The following facts about the HRP 350 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the HRP 350 are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the HRP 350 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the HRP 350 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the HRP 350 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the HRP 350 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Oct 2, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.