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Hitachi

S 4800 II

Metrology & InspectionHitachi S 4800 family
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The Hitachi S 4800 II is a scanning electron microscope. The Hitachi S 4800 II has secondary electron image resolution values of 1.0 nm, 1.4 nm, and 2.0 nm. The Hitachi S 4800 II uses Windows XP.[1][2]

S 4800 II — Inventory photo
Fig. 01S 4800 IIInventory photo[3]

What it is

The Hitachi S 4800 II is a scanning electron microscope used in metrology and inspection.[3][1][2]

How it works

The Hitachi S 4800 II is used as a secondary-electron imaging instrument.[1][2]

Where it fits in the process flow

General reference — not yet source-verified

A scanning electron microscope in metrology and inspection supports process control by examining surface morphology, feature shape, and defect-related detail after fabrication steps.

Applications

The Hitachi S 4800 II is used for secondary-electron imaging in semiconductor metrology and inspection.[1][2]

What do the numbers mean?

Optics & imaging4

Secondary Electron Image Resolution:[1]
Accurate?
Magnification:[1]
Accurate?
Secondary electron image resolution
1.0 nm (15 kV, WD+4 mm); 1.4 nm (1 kV, WD=1.5 mm, deceleration mode); 2.0 nm (1 kV, WD-1.5 mm, normal mode)[1]
Accurate?
Magnification
LM mode: 20 to 2,000X; HM mode: 100 to 800,000X[1]
Accurate?

Control & software2

Includes Installation CDs and software[3]
Accurate?
Operating System
Windows XP[1]
Accurate?

Configuration & options14

No HDD or EDX[3]
Accurate?
Process Type
FA-SEMs/TEMs/Dual Beams[1]
Accurate?
1.0nm (15kV, WD+4mm)[1]
Accurate?
1.4nm (1kV, WD=1.5mm, Deceleration mode)[1]
Accurate?
2.0nm (1kV, WD-1.5mm, Normal mode)[1]
Accurate?
LM mode
20 ~ 2,000X[1]
Accurate?
HM mode
100 ~ 800,000X[1]
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Specimen Stage:[1]
Accurate?
5 Axis Stage Motorization[1]
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Type KK
X: 0 ~ 110mm; Y: 0 ~ 110mm, Z: 1.5 ~ 40mm; T: -5 ~ +70*, R: 360*[1]
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Tool type
Scanning electron microscope (SEM)[3]
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Specimen stage
5-axis stage motorization; Type KK: X 0 to 110 mm, Y 0 to 110 mm, Z 1.5 to 40 mm, T -5 to +70°, R 360°[1]
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Version
200 mm Vintage[4]
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Description
FE SEM[4]
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What type of instrument is the Hitachi S 4800 II?

The Hitachi S 4800 II is a scanning electron microscope.[3][1][2]

Not publicly documented

The following facts about the S 4800 II are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the S 4800 II are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the S 4800 II are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the S 4800 II are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the S 4800 II are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the S 4800 II is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]S 4800 II — Hitachi | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
  3. [3]Inventory photo
  4. [4]fabsurplus.comfabsurplus.com
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Last updated Oct 9, 2026.

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