Dimension 7000

An atomic force microscope measures surface topography by sensing the interaction between a sharp probe and the sample surface. An instrument in this class is used for nanoscale inspection and measurement rather than wafer patterning or material removal.

The Dimension 7000 is an atomic force microscope. The tool class uses a fine probe that scans across a surface while a feedback system tracks surface height changes through probe motion or force interaction.

An atomic force microscope produces a map of surface features from the probe response over the scanned area. The instrument class is used to characterize surface form, texture, and local structure on small features.

The Dimension 7000 fits in the metrology and inspection portion of a semiconductor workflow. The tool class is commonly used after process steps that create or modify surface features so those features can be measured and verified.

An atomic force microscope supports process control by checking surface condition before later integration steps. The tool class is also used to compare measured topography against process targets during development and production monitoring.

The Dimension 7000 is used for surface metrology and inspection on wafer-scale samples. The tool class is applied to examine fine topography, roughness, and local defects on semiconductor and related precision surfaces.

An atomic force microscope is also used in laboratory and process development work where high-resolution surface measurement is needed. The tool class supports analysis of small features that are difficult to resolve with optical inspection alone.