Waferpedia

Bruker

DAFP

Metrology & InspectionBruker DAFP family
Research Quality: 40% complete

Provisional entry — research in progress

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BrukerDAFP
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What it is

Bruker DAFP is also used as a designation for an AFM probe line within Bruker AFM probes.[3]

How it works

The DAFP probe line includes rectangular cantilever probes with antimony doped silicon bodies, reflective aluminum coating, and tip geometries intended for critical dimension and deep trench work.[3]

Where it fits in the process flow

General reference — not yet source-verified

AFM based metrology sits in the inspection flow after pattern formation when surface topography, sidewall shape, or trench geometry must be checked.

What do the numbers mean?

Power & electrical1

Resonant frequency
201-400 kHz[3]
Accurate?

Dimensions & facilities1

Probe category
DAFP Depth - Automated AFM[3]
Accurate?

Configuration & options7

OEM
Bruker[1]
Accurate?
Model
DAFP[2]
Accurate?
Product type
AFM Probe (Atomic Force Microscope)[2]
Accurate?
Category
Metrology & Inspection[1]
Accurate?
Spring constant
15-50 N/m[3]
Accurate?
Cantilever geometry
Rectangular[3]
Accurate?
Number of cantilevers
1[3]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Resonant frequency201-400 kHz[3]

Where are the manuals?

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Not publicly documented

Field notes

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Not publicly documented

The following facts about the DAFP are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the DAFP are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the DAFP are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the DAFP are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the DAFP are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the DAFP is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]waferpedia.comwaferpedia.com
  2. [2]Equipment inventory listing
  3. [3]brukerafmprobes.com — brukerafmprobes.combrukerafmprobes.com
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Last updated Oct 7, 2026.

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