Hitachi S 9380

Models in this family

1. 

   S 9380

   The Hitachi S 9380 is a scanning electron microscope (SEM) used for wafer inspection and measurement, designed for 12-inch wafers.

   Cited variants

   Designation	Generation	Vintage	Changes	Source
   S-9380II	—	—	—	web.archive.org[1]

2. 

   S 9380 CD-SEM

   The Hitachi S 9380 is a CD-SEM (Critical Dimension Scanning Electron Microscope).

3. 

   S 9380 II CD-SEM

   The Hitachi S 9380 II CD-SEM is a critical dimension scanning electron microscope.

Sources