Waferpedia

Comparison ledger

0720 06060 Partversus4071

Applied Materials 0720 06060 Part, Keysight 4071, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0720 06060 PartApplied Materials
4071Keysight
OEMApplied MaterialsKeysight
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0720 06060 PartKeysight 40xx
Specifications
ConfigurationContact Pin 24-20 Awg Crimp Gold Flash[1]With Electroglas EG 4090 & EG 4090 u Prober (8")[2]
Type—PCM Tester[2]
Wafer size (with prober)—8 inch[2]
Prober—Electroglas EG 4090 & EG 4090 u[2]
Vintage—1998[2]

Plan your fab

Building a Test & Probe process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing