Keysight
Provisional entry — research in progress
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The Keysight 4071 is a PCM tester.[1]
The class of probe-and-test equipment evaluates electrical behavior by contacting devices or test structures through probes and applying test stimuli while measuring responses.
Probe-based testers are used during semiconductor test flows to measure wafer-level structures before later assembly or final test steps.
A PCM tester is used on process-control structures that help characterize electrical behavior across a fabrication flow.
A PCM tester is used for wafer-level electrical test of process-control monitor structures.
Probe-and-test equipment is used to check semiconductor devices and test patterns before downstream packaging or product screening.
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The Keysight 4071 is a PCM (process control monitor) tester used for parametric testing of semiconductor wafers.[1]
The following facts about the 4071 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4071 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 4071 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 4071 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 4071 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 4071 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 10, 2026.