Waferpedia

Comparison ledger

.204 PSL WaferversusPuma 9120 Defect

KLA .204 PSL Wafer, KLA Puma 9120 Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA .204 PSL WaferKLA Puma 9120
Specifications
ConfigurationNIST Traceable[1]User Interface Software Version 9.3.309.2.8[3]
Wafer Size8 inch[1]—
TraceabilityNIST[2]—
Compatible ToolsSurfscan 6xy0, Sp1[1]—
NIST TraceableYes[1]—
User Interface Software Version—9.3.309.2.8[4]
Operating System—Windows 2000[4]
Load Port Quantity—2[4]
Wavelength Illumination—370~720 nm[4]
Wavelength Band—Visible, UV[4]
Pixel Sizes—0.16μm, 0.20μm, 0.25μm, 0.39μm, 0.62μm[4]
Array Defect Capture Rate—≥90% (0.16 um, 0.20 um, 0.25 um, 0.39 um, 0.62 um sensitivities)[4]
Array False Defect Rate—≤1.5% (all sizes)[4]
Random Defect Capture Rate—≥90% (0.16 um, 0.20 um, 0.25 um, 0.39 um, 0.62 um sensitivities)[4]
Random False Defect Rate—≤1.5% (all sizes)[4]
Repeatability—≥90% (20 consecutive run on the same DSW wafer)[4]
Number of Inspection Pixel Models—3[5]
Pixel Sizes (sLXX) Installed or Available—sL5, sL8, sL20[5]
Cameras—2[5]
Loader Type—Dual open cassette loader[5]
Software Options: Array Mode Algorithm—Yes[5]
Software Options: Sizing—Yes[5]
Software Options: 9.1 Simulator—Yes[5]
Software Options: RICO Capable—No[5]
Wafer Sizes—200 mm (8 in), 300 mm (12 in)[5]
OEM—KLA[3]
Model—Puma 9120[3]
Category—Metrology & Inspection[4]
Number of Cameras—2[5]

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Sources (5)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]inventory listing
  4. [4]waferpedia.comwaferpedia.com
  5. [5]conationtech.comconationtech.com