Comparison ledger
Cascade Microtech 103-754, Signatone S-302-4, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 103-754Cascade Microtech | S-302-4Signatone |
|---|---|---|
| OEM | Cascade Microtech | Signatone |
| Category | Test & Probe | Test & Probe |
| Wafer size | 6-inch diameter microchamber and thermal chuck | 100mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech 103-754 | Signatone S-302-4 |
| Specifications | ||
| type | x-y-z-θ probe positioner[1] | — |
| installed on | HFTL 50-GHz Small-Signal Probe Station[1] | — |
| quantity in station | two[1] | — |
| station chuck size | 6-inch-diameter microchamber and thermal chuck[1] | — |
| Quantity per station | Two positioners[1] | — |
| Chuck size | 6-inch-diameter microchamber and thermal chuck[1] | — |
| Temperature range | -50 to 200 °C[1] | — |
| Type | — | Four Point Resistivity Probe Station[2] |
| Probe stand | — | 100 mm[2] |
| Probe head | — | 4 point probe head with 5 mil radius tips of 40 mil spacing[2] |
| Measurement use | — | Sheet resistance and resistivity measurements of substrates and thin films[2] |
| Interfaces with | — | Keithley 2450[2] |
| Probe stand size | — | 100 mm[2] |
| Measurement capabilities | — | Sheet resistance and resistivity measurements of substrates and thin films[2] |
| Interfaces | — | Keithley 2450[2] |
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