Cascade Microtech
103-754
What it is
The Cascade Microtech 103-754 is a probe positioner installed on an HFTL 50-GHz Small-Signal Probe Station. The station includes a 6-inch-diameter microchamber and thermal chuck, along with RF and DC measurement equipment. The 103-754 is an x-y-z-θ probe positioner, and two positioners are installed on the station.[2]
How it works
The Cascade Microtech 103-754 is an x-y-z-θ probe positioner on an HFTL 50-GHz Small-Signal Probe Station. The station configuration carries two such positioners. The station includes a 6-inch-diameter microchamber and thermal chuck.[2]
Where it fits in the process flow
General reference — not yet source-verifiedProbe stations generally sit at the electrical test stage of the fabrication flow. Probe stations are used to measure test structures and devices after processing and before packaging. The Cascade Microtech 103-754, as a positioner, is the part of the station that places the probe tip on the device being tested.
Applications
General reference — not yet source-verifiedTypical applications include on-wafer characterization of semiconductor devices, RF and DC parametric testing, and failure analysis of fabricated structures. Probe stations of this kind are also used in process development to monitor device behavior as process conditions change.
What do the numbers mean?
Wafer handling2
Configuration & options6
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What is the Cascade Microtech 103-754?
The Cascade Microtech 103-754 is an x-y-z-θ probe positioner installed on an HFTL 50-GHz Small-Signal Probe Station.[2]
How many 103-754 positioners are used on the probe station?
Two positioners are installed on the station.[2]
What other equipment is part of the station?
The station includes a 6-inch-diameter microchamber and thermal chuck, along with RF and DC measurement equipment.[2]
Not publicly documented
The following facts about the 103-754 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 103-754 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 103-754 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 103-754 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 103-754 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 103-754 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]cnf.cornell.edu — cnf.cornell.educnf.cornell.edu
- [2]103-754 — Cascade Microtech | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Last updated Sep 22, 2026.
