Comparison ledger
Bruker Tesp, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | TespBruker | 1007KLA |
|---|---|---|
| OEM | Bruker | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Bruker Tesp | KLA 1007 |
| Cited variants |
| — |
| Specifications | ||
| Equipment type | Test & Probe[2] | Prober[5] |
| Model | Tesp[3] | 1007[4] |
| Asset description | Prober[3] | — |
| Variant designation | TESP-V2[1] | — |
| Geometry | Rectangular[1] | — |
| Frequency | Nominal 320 kHz[1] | — |
| Spring constant | Nominal 37 N/m[1] | — |
| Tip radius | Nominal 7 nm[1] | — |
| Length | Nominal 123 µm[1] | — |
| Width | Nominal 40 µm[1] | — |
| Manufacturer | — | KLA[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
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