Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Hitachi WA 3300, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | WA 3300Hitachi |
|---|---|---|
| OEM | Applied Materials | Hitachi |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | 2007 Vintage |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Hitachi WA 3300 |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | Wide Area AFM Main Body[2] |
| Type | — | Atomic Force Microscope[2] |
| Wafer size | — | 300 mm (300 mm Chuck)[2] |
| Vintage | — | 2007[2] |
| Optical microscope | — | Drive (Zoom/Focus) and CCD Camera[2] |
| Cantilever modes | — | Fine Mode, Wide Mode, High Aspect[3] |
| Stage | — | XYZ (3-axis) Stage[2] |
| Anti-vibration table | — | Included[2] |
| FOUP transfer unit | — | Includes FOUP, Transfer Robot, Aligner, Controller, Filter Unit[2] |
| Control and data processing | — | Control Unit, Data Processing PC, CRT Display, Controller[2] |
| Description | — | Wide-area AFM[2] |
| Wafer handling | — | 300 mm Chuck[3] |
| AFM sensor | — | Included[2] |
| Camera | — | CCD camera[2] |
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