Waferpedia

Comparison ledger

0010-03254 E ChuckversusS 308 F

Applied Materials 0010-03254 E Chuck, Nikon S 308 F, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0010-03254 E ChuckApplied Materials
S 308 FNikon
OEMApplied MaterialsNikon
Category——
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
Family—Nikon S 308 F
Specifications
Configuration—HDD included[1]
Light source—ArF (193 nm)[2]
Numerical aperture—0.92[2]
Exposure area—26 x 33 mm[2]
Reduction ratio—1:4[2]
Resolution—<65 nm[2]
Throughput (300 mm)—>145 wph[2]
Throughput (200 mm)—>165 wph[2]
Wafer size—200/300 mm[2]
Overlay accuracy—8 nm[2]
Polarization control—POLANO[2]
Wafer size (alternative)—12 inch[1]
Wavelength—193 nm[2]
Lens NA—0.92[2]
Polarization Control—POLANO (optional)[2]
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]web.archive.orgweb.archive.org