Wyko
6000
The WYKO 6000 is a laser interferometer. The WYKO 6000 uses a Fizeau configuration with a 152 mm (6 in.) diameter test beam. The WYKO 6000 offers an optional dual-beam system with 152 mm and 44 mm channels.[1][2]
Plate 01Conserto Interferômetro a laser Wyko 6000
Linoteck Eletrônica IndustrialWatch on YouTube
What it is
How it works
The Wyko 6000 uses a 152 mm test beam and user-friendly software, and the instrument presents pass or fail results and three-dimensional data display with user-selectable removal of aberration.[1][2]
The Wyko 6000 has an optional dual-beam configuration with two channels, including a 152 mm beam for large optics and a 44 mm beam for small optics.[1][2]
Where it fits in the process flow
Applications
The Wyko 6000 is used for optical component testing.[1][2]
The Wyko 6000 is suitable for research optics and general optical testing.[1][2]
- Research
- General optical testing
- Wider range of optics testing
What do the numbers mean?
Optics & imaging6
Performance4
Control & software1
Configuration & options6
- Fizeau configuration[2]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What are the key advantages of using an optical profiler over a contact stylus profilometer?General reference — not yet source-verified
The main advantages are non-contact measurement (no risk of scratching or deforming the sample), faster data acquisition over an area (typically seconds), and the ability to measure soft or sticky surfaces that would be affected by a stylus. In addition, optical profilers provide full three-dimensional topography rather than just a line profile.
What are typical limitations of such instruments?General reference — not yet source-verified
Limitations include sensitivity to vibration and ambient air currents, which can degrade measurement repeatability. Very rough or steep-sloped surfaces may cause shadowing or insufficient signal return. Materials with very low reflectivity (e.g., black rubber) can be difficult to measure unless specialized illumination or coatings are used. Additionally, the lateral resolution is diffraction-limited, typically not as fine as that of scanning electron microscopes, but sufficient for many engineering surfaces.
How is the measurement repeatability and accuracy ensured?General reference — not yet source-verified
Repeatability and accuracy depend on instrument calibration, environmental control, and measurement protocol. Regular calibration using certified step-height standards is performed. The instrument is often placed on a vibration-isolation table and operated in a temperature-stable environment. Software filters and algorithm choices (e.g., for fringe analysis) also influence results.
Not publicly documented
The following facts about the 6000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 6000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 6000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 6000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 6000 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 6000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]web.archive.org — web.archive.orgweb.archive.org
- [2]web.archive.org — web.archive.orgweb.archive.org
- [3]Veeco Metrology Products by Name — web.archive.orgweb.archive.org
Last updated Oct 5, 2026.
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