Teradyne
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
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The Magnum 1 SV is part of the Teradyne Nextest Magnum family of testers.[3]
The following facts about the Nextest Magnum 1 SV are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Nextest Magnum 1 SV are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Nextest Magnum 1 SV are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Nextest Magnum 1 SV are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Nextest Magnum 1 SV are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Nextest Magnum 1 SV is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 7, 2026.
The Advantest 93000 is a tester with listed dedicated, infrastructure, digital, and DC components.
The Advantest 93000 PS 1600 Pin Scale Tester is a semiconductor test system configured with 48 PS1600 channel boards and related DUT interface, RF, DCS-DPS32, and measurement assemblies.
The Advantest C 400 E is a Test & Probe tool documented with a 512-pin configuration and digital and analog setup details.