Teradyne
ETS 800
The Teradyne / Eagle ETS 800 is a production board test system. The ETS 800 is part of Teradyne's precision power and analog test product family.[1][2]
Plate 01ETS 800 最終版
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What it is
The Teradyne ETS 800 is a production board test system used for PCB testing.[2]
How it works
General reference — not yet source-verifiedPCB test systems apply electrical test methods to assembled boards to find defects and verify circuit behavior before release to downstream assembly or use.
Board test platforms in this class commonly combine test instrumentation, software control, and configurable probe or fixture interfaces so the same system can address different board layouts and test point densities.
Where it fits in the process flow
General reference — not yet source-verifiedThe ETS 800 fits in production board test, where assembled printed circuit boards are checked after fabrication and assembly steps and before shipment or integration into higher-level products.
Board test sits downstream of PCB assembly and upstream of final product integration, repair handling, or system-level verification.
Applications
The ETS 800 is used for reliable, high-quality PCB testing in production board test workflows.[2]
What do the numbers mean?
Control & software1
Configuration & options38
- Board Configuration:[1]
- SPU 2112 - 2[1]
- APU 32 - 4[1]
- UPD 64 - 6[1]
- SIU/UCU - 2[1]
- QMST - 2[1]
- HSD 32 - 2[1]
- Quad sector[4]
- General configuration per sector[4]
- · 1 or 2 APU32 cards[4]
- · 1 or 2 SPU2112[4]
- · 3 UPD64[4]
- · 1 SPMB[4]
- · 1 HSD32[4]
- · 1 QMS[4]
- Board Configuration (exemplary)
- SPU 2112 (2), APU 32 (4), UPD 64 (6), SIU/UCU (2), QMST (2), HSD 32 (2)[1]
- Quad sector configuration per sector
- 1 or 2 APU32 cards, 1 or 2 SPU2112, 3 UPD64, 1 SPMB, 1 HSD32, 1 QMS[4]
- Board Configuration (Example 1)
- SPU 2112: 2, APU 32: 4, UPD 64: 6, SIU/UCU: 2, QMST: 2, HSD 32: 2[1]
- Per Sector Configuration
- 1 or 2 APU32 cards, 1 or 2 SPU2112, 3 UPD64, 1 SPMB, 1 HSD32, 1 QMS[4]
- Board Configuration (per Source 1)
- SPU 2112 x2, APU 32 x4, UPD 64 x6, SIU/UCU x2, QMST x2, HSD 32 x2[1]
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Keysight 3070 S 2— Same function class: Test & Probe, nullCompare in depthsource[5]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What types of devices can be tested on a parametric test system like this?General reference — not yet source-verified
Parametric testers are versatile and can test a broad range of semiconductor devices, including individual transistors, integrated circuits, analog and mixed-signal devices, sensors, and passive components, provided the appropriate test fixtures and software are configured.
What is the typical number of test channels or pins available?General reference — not yet source-verified
The number of channels varies by configuration and instrument cards installed, ranging from a few dozen to several hundred independent channels. Systems can be scaled by adding modules to meet specific testing requirements.
How fast are test cycles on such equipment?General reference — not yet source-verified
Test cycle time depends on the complexity of the test program, the number of parameters measured, and the parallelism of the test configuration. Typical parametric testers perform from a few hundred to several thousand tests per second under optimal conditions.
What signal sources and measurement capabilities are typically included?General reference — not yet source-verified
Common capabilities include programmable voltage and current sources (DACs), precision voltmeters and ammeters (ADCs), capacitance meters, and AC signal sources. Many systems also include configurable digital pattern generators and capture logic for mixed-signal testing.
Can the system be integrated with a prober or handler for automated testing?General reference — not yet source-verified
Yes, parametric test systems are designed to interface with wafer probers and package handlers via standard GPIB, USB, or Ethernet interfaces. Automation software coordinates the test flow, device handling, and data logging seamlessly.
Not publicly documented
The following facts about the ETS 800 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the ETS 800 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the ETS 800 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the ETS 800 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the ETS 800 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the ETS 800 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (5)Every fact above is drawn from these public sources
- [1]inventory listing
- [2]Production Board Test (PCB testing) - Teradyne — teradyne.com (May 5, 2026)web.archive.org
- [3]Inventory photo
- [4]inventory listing
- [5]Equipment inventory listing
Last updated Oct 3, 2026.
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