Signatone
TH-760
The Signatone TH-760 is a test head probe station. The Signatone TH-760 is designed for probing devices mounted directly in a test head. The Signatone TH-760 is constructed around a vibration isolation table.[1][2]
What it is
How it works
The TH-760 is constructed around a vibration isolation table.[1][3]
The TH-760 docks the test head beneath a large plate that floats on a cushion of compressed N2 or C.D.A. The TH-760 uses a hole milled into the plate to provide access for probing into the device. The TH-760 places a micropositioner support platen on top of the plate. The TH-760 can use options including CAP, lasers, manual or motorized micropositioners, and active probes.[1][3]
Where it fits in the process flow
Applications
The TH-760 is applied to semiconductor device probing in test head environments.[1][2]
The TH-760 supports probing setups that may use lasers, manual or motorized micropositioners, and active probes.[1][3]
- probing semiconductor devices mounted directly in a test head
- failure analysis and R&D probing
Why won't it start?
Documented failure modes, common issues, and field considerations.
- test head vibration can affect probing of small device geometries
What do the numbers mean?
Optics & imaging1
- Options
- CAP (Computer Aided Probing), lasers, manual or motorized micropositioners, active probes[1]2 sources
Configuration & options8
- Probe station arrangement
- the test head is docked beneath a large plate that floats on a cushion of compressed N2 or C.D.A.[1]2 sources
- Access feature
- a hole is milled into the plate to provide for probing into the device[1]2 sources
- Probe access
- a hole is milled into the plate to provide access for probing into the device[3]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What type of machine is the Signatone TH-760?
What does the TH-760 probe?
The TH-760 is designed for probing devices mounted directly in a test head.[1][3][2]
How is the TH-760 built to improve probing stability?
The TH-760 is constructed around a vibration isolation table.[1][3]
Not publicly documented
The following facts about the TH-760 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the TH-760 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the TH-760 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the TH-760 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the TH-760 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the TH-760 are on record.
Answerable by: an OEM parts catalog or a service engineer
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]web.archive.org — web.archive.orgweb.archive.org
- [2]waferpedia.com — waferpedia.comwaferpedia.com
- [3]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Oct 7, 2026.
