Seiko Epson
The NS 8080 SH is a Seiko Epson IC handler. The NS 8080 SH is a high-speed handler. The NS 8080 SH is an IC test handler with 8-site testing capability.[1][2][3]

The NS 8080 SH is used for testing and sorting chip packages.[3]
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The NS 8080 SH is a Seiko Epson IC handler in the test and probe category.[1][2][3]
The NS 8080 SH supports 8-site testing in a 4 by 2 arrangement.[2][3]
The NS 8080 SH handles QFP, TSOP, CSP, WLCSP, BGA, QFN, PLCC, LGA, and PGA devices.[2][3]
The NS 8080 SH is specified at up to 13,500 units per hour in ambient temperature and up to 8,200 units per hour in high temperature.[2][3]
The NS 8080 SH uses single-phase power at 200 to 240 V AC, 50/60 Hz, with a 6 kVA rating.[3]
The following facts about the NS 8080 SH are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NS 8080 SH are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the NS 8080 SH are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the NS 8080 SH are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NS 8080 SH are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NS 8080 SH is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 10, 2026.