InStrip

The Multitest InStrip handler is also referred to as an InCarrier test handler for singulated packages loaded onto a carrier. The handler incorporates an Inflip module.^{[1][2][3][4][5][6]}

The InStrip handler accommodates testing of multiple devices on a carrier by indexing several stimuli in parallel to a number of devices. The test cell can generate magnetic stimulation using a rotating magnet for magneto-resistive sensors. The handler includes features such as an Inflip module, software upgrade and calibration, and EMI reduction noise filtering.^{[6][1][2][3][4][5]}

IC dies are pre-tested at the wafer level. After singulation, the devices are placed into individual IC packages and then tested using a handler such as the InStrip. Some industry standards require testing of singulated devices to detect damage that may occur during the singulation process.^[6]

The handler is used for testing magneto-resistive (MR) sensors, including anisotropic magneto-resistive (AMR) and giant magneto-resistive (GMR) sensors. The test cell provides customized stimuli for magnetic field testing. Conversion kits are available for package types such as LGA14 3x5, LGA 4x4, and LGA 5x5.^[6][5]