Keysight
4156 C Semiconductor Parameter Analyzer
What it is
The Keysight 4156C (also branded as Agilent 4156C) features four high-resolution source-measure units (SMUs), two voltage source units (VSUs), and two voltage measurement units (VMUs). The instrument provides measurement resolution of one femtoampere and 0.2 microvolt. A high-power SMU is capable of supplying up to plus-or-minus 200 volts and plus-or-minus 1 ampere. An optional 41501B pulse generator module can be added. The 4156C is furnished with Desktop EasyEXPERT software for PC-based graphical instrument control. The instrument comes with over 80 pre-defined, user-modifiable application tests and can automatically save data to a hard disk drive or any networked drive.[1][2][3]
How it works
The 4156C supports sweep measurements, knob sweep measurements, sampling measurements, quasi-static C-V (QSCV) measurements, and stress force functions. Stress force is used for reliability testing of semiconductor devices. The instrument includes fill-in-the-blanks front panel operation and built-in mathematical functions for analyzing measurement results.[4][1]
What do the numbers mean?
Power & electrical6
Optics & imaging3
Control & software2
- Includes Desktop EasyEXPERT software for PC-based GUI instrument control[1]
Configuration & options12
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Configuration+/- 200 Volts and +/- 1 Amp High-Power SMU, - Pulse Generator capabilities available by optional 41501B[1]
- Add onAgilent 41501B Pulse Generator Module[1]
- ConfigurationCan source/sink up to 1 A of current and supply up to +/-200 V of voltage[1]
- Voltage measurement resolution0.2 microvolt[1]
- Maximum source voltage+/-200 V[1]
- Pulse generator optionOptional 41501B Pulse Generator Module[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
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Frequently asked questions
What measurement resolution does the 4156C provide?
The 4156C provides measurement resolution of one femtoampere and 0.2 microvolt.[1]
What are the maximum voltage and current of the high-power SMU?
The high-power SMU can supply up to plus-or-minus 200 volts and plus-or-minus 1 ampere.[1][2][3]
How many source-measure units does the 4156C have?
The 4156C includes four high-resolution source-measure units (SMUs), two voltage source units (VSUs), and two voltage measurement units (VMUs).[1][2][3]
What optional module extends the capabilities of the 4156C?
An optional 41501B pulse generator module can be added to the 4156C.[1][2][3]
What types of measurements can the 4156C perform?
The 4156C can perform sweep measurements, knob sweep measurements, sampling measurements, quasi-static C-V measurements, and stress force functions.[4]
Not publicly documented
The following facts about the 4156 C Semiconductor Parameter Analyzer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 4156 C Semiconductor Parameter Analyzer are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 4156 C Semiconductor Parameter Analyzer are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 4156 C Semiconductor Parameter Analyzer are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 4156 C Semiconductor Parameter Analyzer are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 4156 C Semiconductor Parameter Analyzer is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]testworld.com — testworld.comtestworld.com
- [3]Agilent / HP 4156C Precision Semiconductor Parameter Analyzer, Used — testequipmentdepot.comtestequipmentdepot.com
- [4]https://tjr-lab.mit.edu/wp-content/uploads/2026/05/Agilent-4156C-Precision-Semiconductor-Parameter-Analyzer-Measurement-and-Analysis.pdf — tjr-lab.mit.edutjr-lab.mit.edu
Last updated Sep 25, 2026.
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