Hitachi
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The Hitachi 8820 is a CD-SEM manufactured by Hitachi. The system accepts wafers of 200 mm (8-inch) or 150 mm (6-inch) diameter, with a special carrier available for 50 mm (2-inch) to 125 mm (5-inch) wafers. The CD measurement range is 0.1 to 10 μm, with a measurement reproducibility of ±1 % or 0.005 μm (3 sigma), whichever is larger. Throughput is specified as 20 wafers per hour in continuous measurement with 1 point per chip and 5 chips per wafer. The secondary electron image resolution is 5 nm at an accelerating voltage of 0.8 kV, using a dedicated reference specimen. Magnification covers the range ×1000 to ×150,000 for the SEM image, and approximately ×110 for the optical microscope image.[1]
The Hitachi 8820 uses a Schottky emission electron gun with an accelerating voltage variable from 700 V to 1300 V in 10 V steps. The lens system consists of an electromagnetic condenser lens system and an FCM (final condenser and objective) objective lens. Secondary electrons are detected by a 1-stage detection system. The objective lens aperture is a heating-type movable aperture with four openings selectable from outside the column, allowing fine adjustment. A two-stage deflection scanning coil and an 8-pole electromagnetic stigmator coil (X, Y) are employed. Probe current can be monitored via an incorporated Faraday cup with automatic measurement. The system also includes an optical microscope providing a 1.2 mm square visual field with monochrome image.[1]
Wafer handling in the Hitachi 8820 is performed by a cassette-to-cassette auto loader. Wafers are transferred from an open cassette to the loader chamber by an arm-type robot with random access capability using two cassettes. Vacuum chucking is used on the back of the wafer, and orientation flat detection is done by a non-contact optical sensor. After loading, the loader chamber is automatically evacuated and the wafer is transferred to the stage. The stage has a movement range of X and Y from 0 to 200 mm, driven by pulse motors with computer control up to a maximum speed of 50 mm/s.[1]
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The Hitachi 8820 supports 8-inch (200 mm) and 6-inch (150 mm) wafers, with a special carrier available for 2-inch to 5-inch wafers.[1]
The CD measurement range is 0.1 to 10 μm.[1]
The accelerating voltage is variable from 700 V to 1300 V in 10 V steps.[1]
The electron gun is a Schottky emission type (high brightness and long service life).[1]
The secondary electron image resolution is 5 nm (50 Å) at an accelerating voltage of 0.8 kV with a reference specimen dedicated for resolution measurement.[1]
Throughput is 20 wafers per hour in continuous measurement conditions (1 point per chip, 5 chips per wafer).[1]
The following facts about the 8820 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the 8820 are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 8820 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 8820 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 8820 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 8820 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Last updated Sep 28, 2026.