Electroglas
EG 4090 u+
The Electroglas EG 4090 u+ is a prober that handles 8-inch wafers. The Electroglas EG 4090 u+ runs EG Commander version 9.3 series on Windows 2000. The Electroglas EG 4090 u+ operates on 230V, 50 Hz, 1 phase, 2 wires.[1]
What it is
General reference — not yet source-verifiedThe Electroglas EG 4090 u+ is a wafer prober, a type of semiconductor test equipment used in the final manufacturing steps of integrated circuits.
How it works
The EG 4090 u+ runs the EG Commander software, version 9.3 series, on a Windows 2000 operating system. The system operates on 230 volts, 50 hertz, single phase, two wires.[1]
Where it fits in the process flow
General reference — not yet source-verifiedWafer probing is performed after all front-end-of-line and back-end-of-line processing is complete, immediately before wafer dicing. The prober is the final electrical test step on the full wafer, allowing defective dies to be marked and discarded after singulation.
What can it run?
Process applications and technology nodes documented for this tool.
- Test & Probe
What do the numbers mean?
Power & electrical5
Wafer handling1
Control & software3
- Software EG Commander 9.5 on Windows 2K[2]
Configuration & options5
Vintage & configurations
Documented models & variants
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| EG 4090 u | — | — | — | Equipment inventory listing[5] |
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Accretech UF 300 A Automatic Wafer— Same function class: Test & Probe, UnknownCompare in depthsource[4]
- Accretech UF 3000 Automatic Wafer— Same function class: Test & Probe, UnknownCompare in depthsource[4]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What is a test and probe system used for?General reference — not yet source-verified
It is used to make temporary electrical contact with wafer-level devices so their electrical properties can be measured before the wafer is diced.
What kind of work does this class perform in semiconductor manufacturing?General reference — not yet source-verified
It supports wafer-level inspection, electrical characterization, and screening of dies or test structures for process control and yield monitoring.
How does a machine in this class make contact with the wafer?General reference — not yet source-verified
It uses a precision stage and probe assembly to align the wafer and place fine probes onto conductive pads or test structures.
Where does this class fit in the process flow?General reference — not yet source-verified
It is used after fabrication and before singulation, when devices are still organized on the wafer.
Why is wafer-level test important?General reference — not yet source-verified
It helps identify electrical behavior, process variation, and defective sites before later assembly steps.
Not publicly documented
The following facts about the EG 4090 u+ are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the EG 4090 u+ are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the EG 4090 u+ are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the EG 4090 u+ are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the EG 4090 u+ is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the EG 4090 u+ are on record.
Answerable by: an OEM parts catalog or a service engineer
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (7)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Equipment inventory listing
- [5]Equipment inventory listing
- [6]Equipment inventory listing
- [7]Equipment inventory listing
Last updated Oct 8, 2026.
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