Electroglas

2001 X

Test & Probe Electroglas EG 2001 family

Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

2001 X — Inventory photo — Fig. 012001 XInventory photo^[2]

What it is

General reference — not yet source-verified

A wafer prober is a semiconductor test system that positions a wafer under a probe card to electrically test individual die before they are singulated. The prober steps the wafer to align each die with the probe needles, enabling parametric or functional testing via an external tester.

How it works

General reference — not yet source-verified

Wafer probers use a precision positioning stage to move the wafer in X, Y, and Z axes. A camera system aligns the wafer to the probe card, and the stage lifts the wafer so that each die’s bond pads contact the probe needles. A tester connected to the probe card then performs electrical measurements, and the prober steps to the next die. Many probers include automation features such as cassette handling, pre‑alignment, and inking of failed die.

What do the numbers mean?

Wafer handling4

with Hot chuck, profiler, PRM vision module etc.^[2]
Wafer size: 6 inch (150 mm) and 8 inch (200 mm)^[10]
Wafer size: 6 inch^[2]
Included items: Hot chuck, profiler, PRM vision module^[2]

Configuration & options5

Automatic, 40 channels^[3]
Channels: 40^[3]
Equipment type: Prober^[2]; Automatic^[3]
Channels: 40 channels^[3]

Vintage & configurations

2000-03-12Product history mention^[1]
Electroglas product history mentions the 2001X automatic wafer prober.

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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What wafer size does the Electroglas 2001 X support?

The Electroglas 2001 X supports 6‑inch (150 mm) wafers.^[2]^[3]^[11]

Is the Electroglas 2001 X an automatic prober?

The 2001 X is available as an automatic prober.^[3]

Not publicly documented

The following facts about the 2001 X are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

No publicly documented variants, configuration options, or revision breakpoints of the 2001 X are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 2001 X are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 2001 X are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 2001 X is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the 2001 X are on record.
Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (12)Every fact above is drawn from these public sources

[1]web.archive.org — electroglas.com (Mar 12, 2000)web.archive.org
[2]Inventory photo
[3]Inventory photo
[4]Inventory photo
[5]Inventory photo
[6]Inventory photo
[7]Inventory photo
[8]Inventory photo
[9]Inventory photo
[10]semistarcorp.com — semistarcorp.comsemistarcorp.com
[11]Equipment inventory listing
[12]https://digital.library.unt.edu/ark:/67531/metadc693908/m2/1/high_res_d/532558.pdf — digital.library.unt.edudigital.library.unt.edu