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Advantest

T 5501

Test & ProbeAdvantest T 5501 family
Research Quality: 30% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Advantest T 5501 is a memory test system. The T 5501 supports GDDR3/4-SDRAM, SRAM, and DDR3-SDRAM memory devices. The T 5501 offers a maximum test rate of 1.066 GHz (2.133 GHz in DDR mode).[1]

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What it is

The Advantest T 5501 is an automated test system (ATE) designed for high-speed memory devices. The system supports testing of GDDR3/4-SDRAM, SRAM, and DDR3-SDRAM. The maximum test rate is 1.066 GHz in single-edge mode and 2.133 GHz in double-data-rate (DDR) mode.[1][2]

What do the numbers mean?

Configuration & options7

parts machine[2]
Accurate?
Test target devices
GDDR3/4-SDRAM, SRAM, DDR3-SDRAM, etc.[1]
Accurate?
Maximum number of devices per system
32[1]
Accurate?
Maximum test rate
1.066 GHz / 2.133 GHz (DDR mode)[1]
Accurate?
Maximum test rate (single-edge)
1.066 GHz[1]
Accurate?
Maximum test rate (DDR mode)
2.133 GHz[1]
Accurate?
Supported memory types
GDDR3/4-SDRAM, SRAM, DDR3-SDRAM[1]
Accurate?
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What are the typical timing and parametric capabilities of such testers?General reference — not yet source-verified

Memory test systems provide programmable timing generators with fine edge placement resolution, allowing accurate characterization of access times, hold times, and setup windows. Parametric measurement units can force voltages and measure currents at pins, enabling leakage tests, DC parameter measurements, and voltage-level verification. The exact performance range varies across models and options, but these capabilities are fundamental to the class.

Can the system handle both wafer and package testing without reconfiguration?General reference — not yet source-verified

Many memory test systems are designed with modular architectures that allow them to switch between wafer probe and final test by exchanging hardware interfaces (e.g., probe card adapter versus handler dock). However, the core test electronics remain the same. Some systems offer parallel test capability for multiple DUTs, and the overall throughput depends on the configuration and test program complexity.

Not publicly documented

The following facts about the T 5501 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 5501 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the T 5501 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the T 5501 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the T 5501 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the T 5501 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]web.archive.org — advantest.co.jp (Jun 7, 2007)web.archive.org
  2. [2]inventory listing
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Last updated Oct 2, 2026.

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