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93000 PS 1600 CTH
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
How it works
General reference — not yet source-verifiedA test and probe system brings electrical test access to a semiconductor device before final package assembly.
A probe-based tester uses probe hardware and test instrumentation to contact device pads or structures and apply or measure signals.
Where it fits in the process flow
Applications
General reference — not yet source-verifiedA test and probe system is used for electrical evaluation of semiconductor devices at wafer level.
What do the numbers mean?
Configuration & options6
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Teradyne Catalyst— Same function class: Test & Probe, nullCompare in depthsource[5]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the 93000 PS 1600 CTH are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 93000 PS 1600 CTH are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 93000 PS 1600 CTH are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 93000 PS 1600 CTH are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 93000 PS 1600 CTH are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 93000 PS 1600 CTH is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (5)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]waferpedia.com — waferpedia.comwaferpedia.com
- [5]V 93000 PS 1600 CTH — Advantest | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 9, 2026.
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The Teradyne Catalyst Tester is a semiconductor test system supporting 8-inch and 12-inch wafer sizes.
The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.
