Waferpedia

Tool family

Onto Innovation Nanospec 6100

Models in this family

  1. The NanoSpec 6100 is an automated film thickness measurement system designed for measuring films on semiconductor and magnetic head substrates.

    Cited variants

    DesignationGenerationVintageChangesSource
    Model 6150——Stage accommodates an optional automatic loader (Model 6150 stage).cores.research.utdallas.edu[1]

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]cores.research.utdallas.educores.research.utdallas.edu