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Comparison ledger

5100versus5100 Overlay Measurementversus5100 XP Overlay Measurement

KLA 5100, KLA 5100 Overlay Measurement, KLA 5100 XP Overlay Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
5100KLA
OEMKLAKLAKLA
Category—Metrology & InspectionMetrology & Inspection
Wafer size———
Process node———
Introduced———
Production run———
Lifecycle———
Lifecycle milestones———
Control system———
Generation———
FamilyKLA 5100KLA 5100KLA 5100
Cited variants
  • 5100 XP Overlay Measurement[1]
——
Specifications
Step measurement range100 Å to 300 µm[2]——
Sample table200 mm with vacuum[2]——
Maximum sample thickness20 mm[2]——
Minimum sample length25 mm[2]——
Wafer handlingDual SMIF Cassette loader, 200mm[2]——
Optics12k and 750 micron FOV optical microscopes with light source[2]——
Microscope50 micron FOV with optical measurement, interferometer measurement, and autofocus[2]——
SoftwareWindows NT / VAX[2]——
Operating systemVMS[2]——
BackupSCSI back up unit[2]——
PrinterThermal mini printer[2]——
Tool typemetrology and inspection tool[2]——
Measurement applicationoverlay measurement on wafers[2]——
Wafer size8-inch wafers[2]——
Optical systemoptical microscopes for measurement functions[2]——
Microscope set12k microscope and a 750 micron field-of-view microscope with a light source[2]——
Microscope functions50 micron field-of-view microscope performs optical measurement, interferometer measurement, and autofocus[2]——
Measurement range100 Å to 300 µm[2]——
Control softwareWindows NT / VAX software[2]——
Backup unitSCSI Back up unit[2]——
OS—VMS[3]—
Configuration—Windows NT / VAX software[3]—
Software Version——14.70.01[4]
Robot Type——KLA Internal[4]
Handler——x3 Open Cassette[4]
Wafer Size——8 inch[4]
Sources (4)Every fact above is drawn from these public sources
  1. [1]waferpedia.comwaferpedia.com
  2. [2]waferpedia.comwaferpedia.com
  3. [3]inventory listing
  4. [4]inventory listing