Comparison ledger
KLA 1007, Yxlon Multiplex 5500 M Material, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | |
|---|---|---|
| OEM | KLA | Yxlon |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Yxlon Multiplex 5500 M Material |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | Multiplex 5500 M Material[3] |
| Description | Wafer Prober[1] | X-ray inspection system[4] |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 2007[3] |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | material tester[3] |
| OEM | — | Yxlon[3] |
| Category | — | Test & Probe[3] |
| Product description | — | X-ray inspection system[4] |
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