Comparison ledger
KLA 1007, Teradyne ETS 88 TH AC 2500, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | ETS 88 TH AC 2500Teradyne |
|---|---|---|
| OEM | KLA | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Teradyne ETS 88 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 2017[3] |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Compatability | — | Test MOSfet bellow 1Kw[3] |
| FT Test Condition | — | 1KV, 12A Test Capability, External LCR Meter, UIS Test[3] |
| QA Test Condition | — | 1KV, 12A Test Capability[3] |
| Computer Type | — | CMPTR, TWR, TALON5 MST, WIN7[3] |
| Configuration | — | Calibration Board (ASM7095 Cal/Diag Board) Available[3] |
| Compatibility | — | Test MOSfet bellow 1Kw[3] |
| Calibration Board | — | ASM7095 Cal/Diag Board Available[3] |
| Sector Configuration | — | Two Sector[3] |
| Missing Modules | — | No QPU & QTMU; No HPU< APU, QMS[3] |
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