Comparison ledger
JDSU BT 8000 Series Network Test Platform, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | |
|---|---|---|
| OEM | JDSU | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | KLA 1007 |
| Specifications | ||
| Manufacturer | — | KLA[1] |
| Model | — | 1007[1] |
| Description | — | Wafer Prober[1] |
| Wafer size | — | 150 mm[1] |
| Convertible to 8 inch wafer size | — | Yes[1] |
| Vintage | — | 01.06.1995[1] |
| Make | — | KLA[2] |
| Equipment type | — | Prober[2] |
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