Comparison ledger
Cascade Microtech 11000, LTX-Credence PAX, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11000Cascade Microtech | PAXLTX-Credence |
|---|---|---|
| OEM | Cascade Microtech | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Cascade Microtech 11000 | LTX-Credence PAX |
| Specifications | ||
| Configuration | With antivibration table[1] | — |
| SSBA | — | 1[3] |
| OVI | — | 1[3] |
| HCOVI | — | 1[3] |
| AWG_HSB | — | 1[3] |
| DIG_HB | — | 1[3] |
| DDP_PIN | — | 1[3] |
| DDP_SEQ | — | 1[3] |
| XRF | — | 1[3] |
| Equipment type | — | tester[3] |
| Modules listed | — | SSBA, OVI, HCOVI, AWG_HSB, DIG_HB, DDP_PIN, DDP_SEQ, XRF[3] |
| SSBA count | — | 1[3] |
| OVI count | — | 1[3] |
| HCOVI count | — | 1[3] |
| AWG_HSB count | — | 1[3] |
| DIG_HB count | — | 1[3] |
| DDP_PIN count | — | 1[3] |
| DDP_SEQ count | — | 1[3] |
| XRF count | — | 1[3] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →