Comparison ledger
Applied Materials 0720 06060 Part, Eagle ETS 200 T, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | ETS 200 TEagle |
|---|---|---|
| OEM | Applied Materials | Eagle |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Eagle ETS 200 T |
| Cited variants | — |
|
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[2] | with Electroglas EG 4090 Prober[3] |
| Vintage | — | 2006[3] |
| Product type | — | Tester[3] |
| Model | — | ETS 200 T[3] |
| Make | — | Eagle[3] |
| Discrete test platform | — | Built on proven ETS technology[1] |
| Testing mode | — | True index-parallel testing[1] |
| Handler compatibility | — | Turret and rotary handlers[1] |
| Applications | — | Wafer sort to final test for MOSFETs[1] |
| Integrated measurements | — | UIL, dVSD, Qg and LCR meter[1] |
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