Comparison ledger
Advantest T 5377, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5377Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5377 | KLA 1007 |
| Specifications | ||
| Configuration | Dual Test Head[1] | — |
| Test speed (single data rate) | 143 MHz[2] | — |
| Test speed (DDR mode) | 286 MHz[2] | — |
| Maximum number of devices tested in parallel | 256 DUTs per system[2] | — |
| Number of test heads | Up to 2 stations[2] | — |
| DC units per station | Up to 64[2] | — |
| Programmable loads per station | Up to 256[2] | — |
| Options | MRA4 or AFM[2] | — |
| Target devices | DRAM, SDRAM, DDR devices, SRAM, Flash memory, Direct RDRAM, EPROM, mask ROM[2] | — |
| Wafer size support | 300 mm[2] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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