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Comparison ledger

-407B-1-S-CES293 RobotversusSurfscan 6200 Refurbishment Services

ABM -407B-1-S-CES293 Robot, KLA Surfscan 6200 Refurbishment Services, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMABMKLA
Category——
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyABM -407B-1-S-CES293 RobotKLA Surfscan 6200
Specifications
ModelABM-407B-1-S-CES293[1]—
DescriptionROBOT[1]—
Refurbished RTP RTAAG Associates 4100, 4108, 8108, 8800, 8800i,210, 310, 410, 610, 610I, MPT RTP-600S, 800S, RTP-3000[1]—
KLA-Tencor Spare Parts and ServiceRS-35C,RS-55,RS-75,RS-100,UV-1050,UV-1080,UV-1250,UV-1280,ASET F5 / F5X,AIT Systems,HRP-220 Stylus Profiler[1]—
Refurbished Isotropic Plasma EtcherMatrix, Tegal, Lam Research, Branson/IPC, PlasmaTherm[1]—
Refurbished PECVD, ALD EquipmentCambridge, Oxford PlasmaLab , Plasma-Therm, STS/SPTS, AMAT[1]—
Refurbished Mask AlignerCanon Neutronix PLA501/545, Suss MA200CC, MA8BA8 GEN3, MA8BA8 GEN2, MA8BA8, MA200E[1]—
Refurbished BondingSUSS SB6E, SUSS SB8E, EVG 620 BA, EVG EV501, West Bond 7200AR 7400A[1]—
Refurbished Wafer ProberElectroglas EG 4090u+, EG 4090, EG 2001X, EG 1034X, Cascade PS-21[1]—
Configuration—Refurbishment Only of Client System[2]
Machine type—Wafer surface contamination analysis system and laser particle detector for measuring defect densities on unpatterned wafers[3]
Illumination source—Argon-ion laser at 488 nm[3]
Detection sensitivity—Detection sensitivity down to 0.10 µm[3]
Defect detection capability—Locates, sizes, and counts defects in semiconductor substrate material down to 0.157 um at a 95% capture rate and down to 0.09 um at an 80% capture rate[4]
Scanning method—Laser beam scanning for detecting defect contamination[4]
Data display—Color-coded wafer maps, histograms, and summaries[4]
Substrate diameter—125 mm[4]
Gain range—1 to 8 (gain=1 corresponds to size 63 um or 250 um2; gain=8 corresponds to size 0.12 um or 0.005 um2)[4]
LPD count limit—0 to 99999[4]
Throughput settings—High, medium, normal, low[4]
Detection mechanism—Laser beam illumination, scattered-light collection through an optics system, and photomultiplier tube (PMT) amplification[4]
Refurbishment service scope—Refurbishment only of client system[2]
Refurbishment laser—Solid state laser with 3 year warranty[2]
Refurbishment SBC—New/upgraded SBC replacing the old Trenton SBC[2]
Refurbishment storage—Solid state hard drive and solid state back up hard drive[2]
Refurbishment connectivity—USB 2.0 ready, new USB mouse, new USB keyboard[2]
Refurbishment warranty—1 year parts warranty on system[2]
Refurbishment lead time—12 to 16 weeks (depending on production schedule)[2]
Sources (4)Every fact above is drawn from these public sources
  1. [1]dealer listingsemistarcorp.com
  2. [2]inventory listing
  3. [3]waferpedia.comwaferpedia.com
  4. [4]wiki.nanotech.ucsb.eduwiki.nanotech.ucsb.edu