Comparison ledger
Signatone 1070, Signatone S-302-4, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1070Signatone | S-302-4Signatone |
|---|---|---|
| OEM | Signatone | Signatone |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | 100mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Signatone 1070 | Signatone S-302-4 |
| Specifications | ||
| Make | Signatone[1] | — |
| Model | 1070[1] | — |
| Type | — | Four Point Resistivity Probe Station[2] |
| Probe stand | — | 100 mm[2] |
| Probe head | — | 4 point probe head with 5 mil radius tips of 40 mil spacing[2] |
| Measurement use | — | Sheet resistance and resistivity measurements of substrates and thin films[2] |
| Interfaces with | — | Keithley 2450[2] |
| Probe stand size | — | 100 mm[2] |
| Measurement capabilities | — | Sheet resistance and resistivity measurements of substrates and thin films[2] |
| Interfaces | — | Keithley 2450[2] |
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