Comparison ledger
Perkin Elmer 1050 UV-VIS, Rigaku TXRF 3760 XRF, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1050 UV-VISPerkin Elmer | TXRF 3760 XRFRigaku |
|---|---|---|
| OEM | Perkin Elmer | Rigaku |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | In-Vacuum Wafer Robotic Transfer System |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Perkin Elmer 1050 UV-VIS | Rigaku TXRF 3760 XRF |
| Specifications | ||
| Asset ID | 82948[1] | — |
| Last Confirm Date | August 23, 2024[1] | — |
| Manufacturer | Perkin Elmer[1] | — |
| Model | 1050[1] | — |
| Instrument type | Spectrometer[1] | — |
| Use | Analyzing ultraviolet and visible light absorption spectra[1] | — |
| Wafer size | — | In-Vacuum Wafer Robotic Transfer System[2] |
| Optics | — | Sweeping TXRF Software[2] |
| Beam configuration | — | 3-beam TXRF system[2] |
| Detector | — | Nitrogen-free detector[2] |
| Sample stage | — | Sample stage system[2] |
| Transfer system | — | In-vacuum wafer robotic transfer system[2] |
| Communication | — | ECS/GEM communication software[2] |
| Optics software | — | Sweeping TXRF software[2] |
| Capability | — | ZEE-TXRF capability[2] |
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