Waferpedia

Comparison ledger

Plasmalab 80 PlusversusPlasmaPro80

Oxford Instruments Plasmalab 80 Plus, Oxford Instruments PlasmaPro80, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
Plasmalab 80 PlusOxford Instruments
PlasmaPro80Oxford Instruments
OEMOxford InstrumentsOxford Instruments
CategoryEtchEtch
Wafer size200mm200mm
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyOxford Instruments Plasmalab 80Oxford Instruments PlasmaPro80
Cited variants—
  • Oxford PlasmaPro80, RIE dry etcher, fluorine chemistry (RIE 1)[1]
  • Oxford PlasmaPro80, RIE dry etcher, fluorine chemistry (RIE 2)[1]
  • RIE 1[1]
  • RIE 2[1]
Specifications
Tool IDDE-04[2]—
TypeReactive Ion Etching (RIE)[2]—
Designcompact open-loading tool[2]—
RF generator600W[2]—
Wafer capacityup to 200mm wafers[2]—
Process gasesCF4, Ar, O2, SF6, CHF3[2]CHF3, SF6, O2, Ar[1]
SuitabilityR&D or small-scale production[2]—
RF power600W[2]—
Maximum wafer size200mm[2]200 mm[1]
Tool typeReactive Ion Etching (RIE)[2]RIE dry etcher[1]
Wafer sizeUp to 200mm[2]100mm wafers[1]
Loading typeOpen load[2]—
-ProcessPECVD—
-Voltage208 VAC, 3 Phase—
-Equipment componentMain body—
DescriptionOpen load reactive ion etch system[3]—
Wafer size designed for100 mm[3]—
Wafer size maximum200 mm[3]—
Platen size238 mm[3]—
Power range< 270 W[3]—
Etch targetsCompound semiconductors and metals[3]—
OEM—Oxford Instruments[1]
Model—PlasmaPro80[1]
Chemistry—fluorine chemistry[1]
Maximum power—300 W @ 13.56 MHz[1]
Load system—Open-load system (no load lock)[1]
Wafer handling—chips to wafer up to 200mm[1]
Applications—hBN, SiGe, graphite and graphene soft etching[1]
Endpoint detection—Laser reflectometry/interferometry end-point-detection[1]
Process type—RIE (Reactive Ion Etching), dry etcher[1]
Wafer size (max)—200 mm[1]
Loading design—Open loading design (quick wafer loading/unloading)[4]
Wafer temperature control—Superior wafer temperature uniformity[4]
Compliance standards—Semi S2/S8[4]
Process gases (RIE 1)—CHF3, SF6, O2, Ar[1]
Process gases (RIE 2)—CF4, CHF3, SF6, O2, Ar[1]
Wafer capacity (RIE 2)—100 mm wafers only, no chips[1]
Endpoint detection (RIE 2)—Laser reflectometry/interferometry[1]

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Sources (4)Every fact above is drawn from these public sources
  1. [1]epfl.chepfl.ch
  2. [2]nano.upenn.edunano.upenn.edu
  3. [3]cores.research.asu.educores.research.asu.edu
  4. [4]semitech.com.trsemitech.com.tr