Comparison ledger
KLA 1007, Veeco Four Point, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Four PointVeeco |
|---|---|---|
| OEM | KLA | Veeco |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Veeco Four Point |
| Cited variants | — | |
| Specifications | ||
| Manufacturer | KLA[3] | — |
| Model | 1007[3] | — |
| Description | Wafer Prober[3] | — |
| Wafer size | 150 mm[3] | — |
| Convertible to 8 inch wafer size | Yes[3] | — |
| Vintage | 01.06.1995[3] | — |
| Make | KLA[4] | — |
| Equipment type | Prober[4] | — |
| Function | — | Resistivity and sheet resistance measurement[1] |
| Penetrate voltage | — | 170 V short pulse[1] |
| Semiconductor type determination | — | N or P type[1] |
| Measurement | — | Resistivity[1] |
| Model designation | — | FP-100[1] |
| Measurement modes | — | Sheet resistance, bulk resistivity, thickness, type test[2] |
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