Comparison ledger
Keysight Medalist i 3070 ICT, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Medalist i 3070 ICTKeysight | 1007KLA |
|---|---|---|
| OEM | Keysight | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight Medalist | KLA 1007 |
| Specifications | ||
| Configuration | Series 6[1] | — |
| Voltage | 415 Vac[1] | — |
| Tool type | In Circuit Tester[2] | — |
| Category | Test & Probe[1] | — |
| Power | 50/60 Hz[1] | — |
| System | Four Module system (2 module ready system)[1] | — |
| Module 2 | empty[1] | — |
| Modules 0 and 1 | absent[1] | — |
| Module 3 | probe; debug port; cards 1 asru n revision; cards 2 hybrid advanced double density; cards 3 hybrid advanced double density; cards 4 hybrid advanced double density; cards 5 hybrid advanced double density; cards 6 control xtpb 64; cards 7 hybrid advanced double density; cards 8 hybrid advanced double density; cards 9 hybrid advanced double density; cards 10 hybrid advanced double density; cards 11 access[1] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Wafer size | — | 150 mm[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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