Comparison ledger
Electroglas EG 4090, Signatone 1070, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EG 4090Electroglas | 1070Signatone |
|---|---|---|
| OEM | Electroglas | Signatone |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas EG 4090 | Signatone 1070 |
| Cited variants |
| — |
| Specifications | ||
| Configuration | with Agilent 4071[2] | — |
| Equipment type | PCM Tester[2] | — |
| Associated wafer size | 200 mm[1] | — |
| Probe family description | Thin wafer probers[1] | — |
| Stated performance focus | Fast probing for high throughput of small die[1] | — |
| Related instrument | Agilent 4071[2] | — |
| Make | — | Signatone[3] |
| Model | — | 1070[3] |
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