Comparison ledger
Applied Materials 0720 06060 Part, Electroglas EG5, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | EG5Electroglas |
|---|---|---|
| OEM | Applied Materials | Electroglas |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | 150mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Electroglas EG5 |
| Cited variants | — | |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[2] | — |
| Product line | — | EG5|300[1] |
| Variant | — | ARGOS[1] |
| Description | — | Electroglas' highest accuracy 300mm wafer prober[1] |
| Probe-to-pad accuracy | — | ±2.5 micron[1] |
| Stepping accuracy | — | 1.0 micron[1] |
| Wafer sizes handled | — | 150mm, 200mm, and 300mm wafers[1] |
| Variant description | — | Fine-pitch probing for in-line parametric test structures[1] |
| Tool type | — | wafer prober[1] |
| Accuracy positioning | — | probe-to-pad accuracy of ±2.5 micron[1] |
| Handled wafer sizes | — | 150mm, 200mm, 300mm[1] |
| Model relation | — | EG5|300e is a fine-pitch probing model for in-line parametric test structures[1] |
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