Comparison ledger
Applied Materials 0010-22161 High EFF RF Match, Keysight 4155 C Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-22161 High EFF RF MatchApplied Materials | |
|---|---|---|
| OEM | Applied Materials | Keysight |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-22161 High EFF RF Match | Keysight 4155 C Semiconductor Parameter Analyzer |
| Cited variants | — |
|
| Specifications | ||
| Make | Applied Materials[2] | — |
| Model | 0010-22161[2] | 4155 C[4] |
| Description | HTESC PH 1 REV A[3] | — |
| Condition | Used[3] | — |
| Stock Number | BM6628[3] | — |
| Manufacturer | — | Keysight / Agilent[4] |
| Instrument type | — | Semiconductor Parameter Analyzer[4] |
| Included software | — | Desktop EasyEXPERT standard edition[1] |
| Measurement functions | — | dc or pulsed force/measure, stress force, voltage/current sweep, sampling (time domain), and C-V measurement[1] |
| Maximum number of sampling points | — | 10,001 (linear)[1] |
| Maximum number of VAR1 sweep steps | — | 1001[1] |