Comparison ledger
Applied Materials 0010-03485 Magnet Assy, Wyko TOPO-3D, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | TOPO-3DWyko |
|---|---|---|
| OEM | Applied Materials | Wyko |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | Wyko TOPO-3D |
| Specifications | ||
| Configuration | WP AL 300mm PVD[1] | — |
| OEM | Applied Materials[1] | — |
| Model | 0010-03485[1] | — |
| Description | MAGNET ASSY, WP AL 300MM PVD[2] | — |
| Process | PVD[3] | — |
| Wafer size | 300mm[4] | — |
| Version | Spares[4] | — |
| Part Number | 0010-03485[1] | — |
| Manufacturer | Applied Materials[1] | — |
| Process Type | PVD (Physical Vapor Deposition)[1] | — |
| Application (Material) | Aluminum (AL)[1] | — |
| Wafer Diameter (associated) | 300 mm[1] | — |
| Document title reference | — | TOPO-3D Power Spectral Density, ISO Optical Surface Specifications, and BRDF Calculations[5] |
| Measurement technique | — | White light interferometry (non-contact)[6] |
| Measurement capability | — | 3D surface topography, roughness, step height, waviness[6] |
| Vertical resolution | — | Sub-nanometer[6] |
| Eyepiece | — | Binocular[6] |
| Optical head | — | Black turret-style[6] |
| Form factor | — | Benchtop[6] |
| Controller | — | WYKO Phase Measurement Interface (PMI)[7] |
| Included objectives | — | PX1.5, PX5, PX20, PX40 Mirau interferometric objectives[7] |
| Sample stage | — | Adjustable[6] |
| Document reference | — | TOPO-3D Power Spectral Density, ISO Optical Surface Specifications, and BRDF Calculations (1993)[5] |