Comparison ledger
Applied Materials 0010-03254 E Chuck, Chroma 3380 P, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03254 E ChuckApplied Materials | 3380 PChroma |
|---|---|---|
| OEM | Applied Materials | Chroma |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | Chroma 3380 P |
| Specifications | ||
| Clock rate | — | 50/100 MHz[1] |
| Data rate | — | 50/100 Mbps[1] |
| I/O pins | — | 1024 I/O pins (max. 1280 I/O pins)[1] |
| Parallel testing | — | Up to 1024 sites parallel testing[1] |
| Pattern memory | — | 32/64/128 pattern memory[1] |
| Capture memory per pin | — | 16M capture memory per pin[1] |
| VI source | — | Various VI source[1] |
| Hardware architecture | — | Flexible hardware architecture with interchangeable I/O, VI, and ADDA[1] |
| Trim/match function | — | Real parallel trim/match function[1] |
| Measurement unit | — | Time and frequency measurement unit (TFMU)[1] |
| STDF tools support | — | Supported[1] |
| Test program/pattern converter | — | Supported; J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.[1] |
| AD/DA test | — | Option[1] |
| SCAN test | — | Option; max. 2G M/chain[1] |
| ALPG test | — | Option for embedded memory[1] |
| Programming language | — | CRAFT C/C++[1] |
| Operating environment | — | User-friendly Windows 7 environment[1] |
| Design | — | All-in-one design for test head only[1] |
| Product type | — | VLSI test system[1] |
| STDF support | — | STDF tools support[1] |